Pippel, E., Hähnel, A. and Woltersdorf, J.
Silicates Industriels 64, pp 15-19 (1999) Using energy filtered TEM (EFTEM) the chemical bonding state of silicon across the interlayer between SiC fibre and glass matrix was determined and a sublayer of carbidic silicon at the glass side of the carbon rich layer region was found. The microstructural and nanochemical results enabled a refined model of the interlayer formation in the Si-C-O system to be formulated.