SFM characterization of SrBi2Ta2O9 thin films for nanoscale memory applications

Gruvermann, A., Hironaka, K., Ikeda, Y., Satyalakshmi, K. M., Pignolet, A., Alexe, M., Zakharov, N. D. and Hesse, D.

Integrated Ferroelectrics 27, pp 159-169 (1999)