Major Research Collaborations

TESIN

AbstractPeople
Publications
ProjectsAlumni

2007

Himcinschi, C. , M. Reiche , R. Scholz , S. H. Christiansen , and U. Gösele
Compressive uniaxially strained silicon on insulator by prestrained wafer bonding and layer transfer.
Applied Physics Letters 90 (23) , p 231909/1-3 (2007)

Himcinschi, C. , I. Radu , F. Muster , R. Singh , M. Reiche , M. Petzold , U. Gösele , and S. H. Christiansen
Uniaxially strained silicon by wafer bonding and layer transfer.
Solid State Electronics 51 (2) , p 226-230 (2007)

Himcinschi, C. , R. Singh , I. Radu , A. P. Milenin , W. Erfurth , M. Reiche , U. Gösele , S. H. Christiansen , F. Muster , and M. Petzold
Strain relaxation in nanopatterned strained silicon round pillars.
Applied Physics Letters 90 (2) , p 021902/1-3 (2007)

2006

Radu, I. , M. Reiche , C. Himcinschi , R. Singh , S. H. Christiansen , and U. Gösele
Comparison of SiGe virtual substrates for the fabrication of strained silicon-on-insulator (sSOI) using wafer bonding and layer transfer.
ECS Transactions 3 (7) , p 317-324 (2006)

Reiche, M.
Semiconductor wafer bonding.
Physica Status Solidi A 203 (4) , p 747-759 (2006)

Kittler, M. , M. Reiche , T. Arguirov , W. Seifert , and X. Yu
Silicon-based light emitters.
Physica Status Solidi A 203 (4) , p 802-809 (2006)

Kittler, M. , X. Yu , O. F. Vyvenko , M. Birkholz , W. Seifert , M. Reiche , T. Wilhelm , T. Arguirov , A. Wolff , W. Fritzsche , and M. Seibt
Self-organized pattern formation of biomolecules at silicon surfaces: Intended application of a dislocation network.
Materials Science & Engineering C 26 (5-7) , p 902-910 (2006)

Himcinschi, C. , I. Radu , R. Singh , W. Erfurth , A. P. Milenin , M. Reiche , S. H. Christiansen , and U. Gösele
Relaxation of strain in patterned strained silicon investigated by UV Raman spectroscopy.
Materials Science & Engineering B 135 (3) , p 184-187 (2006)

Radu, I. , C. Himcinschi , R. Singh , M. Reiche , U. Gösele , S. H. Christiansen , D. M. Buca , S. Mantl , R. Loo , and M. Caymax
sSOI fabrication by wafer bonding and layer splitting of thin SiGe virtual substrates.
Materials Science & Engineering B 135 (3) , p 231-234 (2006)

2005

Radu, I. , R. Singh , M. Reiche , U. Gösele , and S. H. Christiansen
Wafer bonding involving strain-relaxed SiGe.
Materials Science & Engineering B 124-125 , p 158-161 (2005)

Singh, R. , I. Radu , M. Reiche , R. Scholz , D. Webb , U. Gösele , and S. H. Christiansen
Investigation of hydrogen implantation-induced blistering in SiGe.
Materials Science & Engineering B 124-125 , p 162-165 (2005)

Kittler, M. , M. Reiche , T. Arguirov , W. Seifert , and X. Yu
Dislocation engineering for a silicon-based light emitter at 1.5 mm.
IEDM Technical Digest , p 1027-1030 (2005)

Kittler, M. , T. Arguirov , W. Seifert , X. Yu , and M. Reiche
Silicon based light emitters for on-chip optical interconnects.
Solid State Phenomena 108/109 , p 749-754 (2005)

Singh, R. , I. Radu , M. Reiche , U. Gösele , S. H. Christiansen , and D. Webb
Wafer bonding and layer transfer approach for strained silicon-on-insulator (sSOI) fabrication.
Proceedings of the International Symposium Semiconductor Wafer Bonding VIII 2005-02 , Ed. K. D. Hobart , S. Bengtsson , H. Baumgart , T. Suga , C. E. Hunt p 89-95 The Electrochemical Society, Pennington, USA (2005)

Radu, I. , R. Singh , M. Reiche , U. Gösele , B. Kuck , T. Grabolla , B. Tillack , and S. H. Christiansen
Silicon wafer bonding using deposited and thermal oxide: A comparative study.
Proceedings of the International Symposium Semiconductor Wafer Bonding VIII 2005-02 , Ed. K. D. Hobart , S. Bengtsson , H. Baumgart , T. Suga , C. E. Hunt p 400-405 The Electrochemical Society, Pennington, USA (2005)

Christiansen, S. H. , R. Singh , I. Radu , M. Reiche , U. Gösele , D. Webb , S. Bukalo , and B. Dietrich
Strained silicon on insulator (SSOI) by waferbonding.
Materials Science in Semiconductor Processing 8 (1-3) , p 197-202 (2005)

2004

Cai, J. , P. M. Mooney , S. H. Christiansen , H. Chen , J. O. Chu , and J. A. Ott
Strain relaxation and threading dislocation density in helium implanted and annealed Si1-xGex/Si(001) heterostructures.
Journal of Applied Physics 95 (10) , p 5347-5351 (2004)

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