Defects in Solar Cells and Devices
Abstract
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O. Breitenstein, J. Bauer
The SEM-EBIC (electron beam induced current) technique is able to image recombination centres and other electronic inhomogeneities in solar cells affecting the short circuit current of the cell. Together with thermography this enables the imaging of localized imperfections important for the cell efficiency. The EBIC image of a silicon solar shows dark contrast due to recombination centres within the material.
